Ion irradiation effects on graphite with scanning tunneling microscope
نویسندگان
چکیده
منابع مشابه
Optimization of Electrochemical Etching Parameters in FIM/STM Tungsten Nanotip Fabrication
Field Ion Microscopy (FIM) and Scanning Tunneling Microscopy (STM) have found a wide application in nanotechnology. These microscopes use a metallic nanotip for image acquisition. Resolution of FIM and STM images depends largely on the radius of nanotip apex; the smaller the radius the higher the resolution. In this research, for tungsten nanotip fabrication, electrochemical etching of tungsten...
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